Depth of Depletion Region Associated with Source Solution

STEP 0: Pre-Calculation Summary
Formula Used
Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor))
xdS = sqrt((2*[Permitivity-silicon]*Φo)/([Charge-e]*NA))
This formula uses 2 Constants, 1 Functions, 3 Variables
Constants Used
[Permitivity-silicon] - Permittivity of silicon Value Taken As 11.7
[Charge-e] - Charge of electron Value Taken As 1.60217662E-19
Functions Used
sqrt - A square root function is a function that takes a non-negative number as an input and returns the square root of the given input number., sqrt(Number)
Variables Used
Source's Depth of Depletion Region - (Measured in Meter) - Source's Depth of Depletion Region is the depletion region forms near the source terminal when a voltage is applied to the gate terminal.
Built in Junction Potential - (Measured in Volt) - Built in Junction Potential refers to the potential difference or voltage that exists across a semiconductor junction when it is not connected to an external voltage source.
Doping Concentration of Acceptor - (Measured in Electrons per Cubic Meter) - Doping Concentration of Acceptor refers to the concentration of acceptor atoms intentionally added to a semiconductor material.
STEP 1: Convert Input(s) to Base Unit
Built in Junction Potential: 2 Volt --> 2 Volt No Conversion Required
Doping Concentration of Acceptor: 1.32 Electrons per Cubic Centimeter --> 1320000 Electrons per Cubic Meter (Check conversion ​here)
STEP 2: Evaluate Formula
Substituting Input Values in Formula
xdS = sqrt((2*[Permitivity-silicon]*Φo)/([Charge-e]*NA)) --> sqrt((2*[Permitivity-silicon]*2)/([Charge-e]*1320000))
Evaluating ... ...
xdS = 14875814.9060508
STEP 3: Convert Result to Output's Unit
14875814.9060508 Meter --> No Conversion Required
FINAL ANSWER
14875814.9060508 1.5E+7 Meter <-- Source's Depth of Depletion Region
(Calculation completed in 00.004 seconds)

Credits

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Created by banuprakash
Dayananda Sagar College of Engineering (DSCE), Bangalore
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Heritage Insitute of technology (HITK), Kolkata
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MOS Transistor Calculators

Sidewall Voltage Equivalence Factor
​ LaTeX ​ Go Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage)))
Fermi Potential for P Type
​ LaTeX ​ Go Fermi Potential for P Type = ([BoltZ]*Absolute Temperature)/[Charge-e]*ln(Intrinsic Carrier Concentration/Doping Concentration of Acceptor)
Equivalent Large Signal Junction Capacitance
​ LaTeX ​ Go Equivalent Large Signal Junction Capacitance = Perimeter of Sidewall*Sidewall Junction Capacitance*Sidewall Voltage Equivalence Factor
Zero Bias Sidewall Junction Capacitance per Unit Length
​ LaTeX ​ Go Sidewall Junction Capacitance = Zero Bias Sidewall Junction Potential*Depth of Sidewall

Depth of Depletion Region Associated with Source Formula

​LaTeX ​Go
Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor))
xdS = sqrt((2*[Permitivity-silicon]*Φo)/([Charge-e]*NA))

What happens to the depth of the depletion region when a MOSFET is in the off state?

In the off state, when the gate-source voltage is below the threshold voltage, the depletion region depth in the source is significant, preventing the flow of current between the source and drain.

How to Calculate Depth of Depletion Region Associated with Source?

Depth of Depletion Region Associated with Source calculator uses Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)) to calculate the Source's Depth of Depletion Region, The Depth of Depletion Region Associated with Source formula is defined as The depletion region forms near the source terminal when a voltage is applied to the gate terminal. Source's Depth of Depletion Region is denoted by xdS symbol.

How to calculate Depth of Depletion Region Associated with Source using this online calculator? To use this online calculator for Depth of Depletion Region Associated with Source, enter Built in Junction Potential o) & Doping Concentration of Acceptor (NA) and hit the calculate button. Here is how the Depth of Depletion Region Associated with Source calculation can be explained with given input values -> 1.5E+7 = sqrt((2*[Permitivity-silicon]*2)/([Charge-e]*1320000)).

FAQ

What is Depth of Depletion Region Associated with Source?
The Depth of Depletion Region Associated with Source formula is defined as The depletion region forms near the source terminal when a voltage is applied to the gate terminal and is represented as xdS = sqrt((2*[Permitivity-silicon]*Φo)/([Charge-e]*NA)) or Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)). Built in Junction Potential refers to the potential difference or voltage that exists across a semiconductor junction when it is not connected to an external voltage source & Doping Concentration of Acceptor refers to the concentration of acceptor atoms intentionally added to a semiconductor material.
How to calculate Depth of Depletion Region Associated with Source?
The Depth of Depletion Region Associated with Source formula is defined as The depletion region forms near the source terminal when a voltage is applied to the gate terminal is calculated using Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)). To calculate Depth of Depletion Region Associated with Source, you need Built in Junction Potential o) & Doping Concentration of Acceptor (NA). With our tool, you need to enter the respective value for Built in Junction Potential & Doping Concentration of Acceptor and hit the calculate button. You can also select the units (if any) for Input(s) and the Output as well.
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